Figure 1 from Inline automated defect classification: a novel approach to defect management | Semantic Scholar
Efficient Training for Automatic Defect Classification by Image Augmentation | Semantic Scholar
WACV18: Efficient Training for Automatic Defect Classification by Image Augmentation - YouTube
Design based automatic defect classification at advanced technology nodes: DI: Defect inspection and reduction | Semantic Scholar
Automatic Final Visual Inspection System FP-9200 | SCREEN PE Solutions Co., Ltd.
AutoDefect: Defect text classification in residential buildings using a multi-task channel attention network - ScienceDirect
Automatic Defect Inspection Using the NVIDIA End-to-End Deep Learning Platform - Edge AI and Vision Alliance
Machine growth deep learning to build an automatic defect classification system
Automated defect analysis in electron microscopic images | npj Computational Materials
Automatic Defect Inspection Using the NVIDIA End-to-End Deep Learning Platform | NVIDIA Technical Blog
Defect Classification Using Machine Vision
Deep learning based automatic defect classification in through-silicon Via process: FA: Factory automation | Semantic Scholar
ADAS | Automated Visual Inspection LLC
Design based automatic defect classification at advanced technology nodes: DI: Defect inspection and reduction | Semantic Scholar
Automated defect detection and classification in ashlar masonry walls using machine learning - ScienceDirect
Applied Sciences | Free Full-Text | A Deep Convolutional Neural Network-Based Multi-Class Image Classification for Automatic Wafer Map Failure Recognition in Semiconductor Manufacturing
TYNESYS
TrueADC Software - Onto Innovation
A CNN-Based Transfer Learning Method for Defect Classification in Semiconductor Manufacturing
Automatic Defect Recognition | Sadra Naddaf
Machine growth deep learning to build an automatic defect classification system - Zhangjiagang Haina Automation Equipment Co., Ltd
Automatic defect classification (ADC) solution using data-centric artificial intelligence (AI) for outgoing quality inspections in the semiconductor industry | SPIE Advanced Lithography + Patterning
Automatic Defect Classification on a Production Line | SpringerLink
Table I from SEM ADC (Auto Defect Classification): How it improves the Cost of Ownership without Risk of Yield Loss | Semantic Scholar
Applied Sciences | Free Full-Text | Automated Defect Detection Using Threshold Value Classification Based on Thermographic Inspection
